pub(crate) async fn wake<H>(
hal: &mut H,
device_addr: u8,
) -> Result<(), AteccError<H::Error>>where
H: AteccHal,Expand description
Perform the wake sequence and verify the chip’s response.
On success the chip is awake and ready to receive a command.
§Errors
AteccError::WakeFailedif the response does not matchWAKE_RESPONSE_OK.AteccError::SelfTestFailureif the response is the self-test failure pattern. The chip is unusable until the next power cycle.AteccError::Halif the HAL itself reports an I2C or GPIO error.