Expand description
Error types for the ATECC608B driver.
Each layer maps its specific failure modes to a variant of AteccError.
The error type is generic over the HAL error so callers can match on the
exact reason without losing typing information.
Upper layers (the firmware HID dispatcher, the host CLI) often need to
distinguish categories of failure (chip-side vs. communication-side)
without naming the concrete HalError type. AteccErrorKind is the
non-generic projection of AteccError intended for that use: it carries
the same shape information (which variant fired) but no HAL payload, so it
can travel through generic-erased layers and be serialized as a single
u8 for transport over the USB-HID protocol.
Enums§
- Atecc
Error - Error returned by every public method of
crate::Atecc. - Atecc
Error Kind - Non-generic projection of
AteccError. - Chip
Error - Errors reported by the chip itself via a 4-byte response frame.
Constants§
- ATECC_
ERR_ SUB_ BAD_ CRC - Stable wire-format sub-code for the bad-CRC variant.
- ATECC_
ERR_ SUB_ BUFFER_ TOO_ SMALL - Stable wire-format sub-code for the buffer-too-small variant.
- ATECC_
ERR_ SUB_ HAL - Stable wire-format sub-code for the HAL-error variant.
- ATECC_
ERR_ SUB_ MALFORMED_ RESPONSE - Stable wire-format sub-code for the malformed-response variant.
- ATECC_
ERR_ SUB_ SELF_ TEST_ FAILURE - Stable wire-format sub-code for the self-test-failure variant.
- ATECC_
ERR_ SUB_ TIMEOUT - Stable wire-format sub-code for the timeout variant.
- ATECC_
ERR_ SUB_ WAKE_ FAILED - Stable wire-format sub-code for the wake-failed variant.